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Parallelism per X


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I can't quite figure this out in my head, but if you:
1) made an alignment to your datum
2) defined the feature of interest (a plane?) with respect to that alignment
3) then constrained the normal so it always evaluates parallel to the datum
...then would reporting flatness get the same results as reporting parallelism?
If so you could use flatness ref and get the result you want.
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  • 2 weeks later...
Maybe scan the plane with high density points over the 72 inches. Then create additional planes selecting a group of points, in approx. a 12" square, and repeat this moving every inch or two. Check the Parallelism of these recalled planes and evaluate it to .0001." It would be a lot of tedious programming, but would satisfy your customer's requirement.

Is there an indicator accurate enough to set it up and a surface plate and indicate the surface?
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