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measurements with patterned features


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I am measuring the relationship between patterned features. For example, I have a 3d curve. I need to create an intersection point on the curve, so I created a theoretical plane at a given angle. I patterned this plane to rotate 1° 11 times.

Next, I created an intersection of the 3d curve and the patterned plane, which created an array of 11 intersection points.

Next, I created a caliper distance between Intersection1(1) and Intersection1(2) and applied a tolerance for the Z direction. I repeated this 9 more times.

My question is: Is there a way to use a loop on the characteristic to select Int1(1) and Int1(2), then Int1(2) and Int1(3), and so on? WITHOUT PCM.....
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https://qualityforum.zeiss.com/topic/13546-measurements-with-patterned-features/
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I have tried all sorts of ways to get this to happen and unfortunately, I have not found anything that works. The best I have come up with is to create the first characteristic, copy and paste it, and then change from the 1 to 2, to be 3 to 2, and the next 3 to 4, etc. so you at least are only changing 1 feature within the characteristic. I wish the software was a little more intuitive in certain cases.

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In the caliper distance tool, you can enter the features Int1(1,10,1) and Int1(2,11,1), and it will pattern the characteristic to give you 10 element-to-element dimensions.

At least, that's what I do for angles. Maybe it doesn't work for the caliper tool...
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