O-Inspect: Edge detection method "Correlation"

[[No...]]

Has anyone ever used the edge detection method "Correlation"? In training thy never showed us how to use it. I have a very vague idea how it might work, but how does one define a reference edge? The info in the ancient optics manual is more than sparse.

[[Cl...]]

Yes sir, you are correct, the only thing I could find in the manual about "edge analysis" (page 58)
only explains "Threshold" & "Rise" it makes no mention of "Correlation". I don't remember our
instructor talking about it either?

Really confusing what they left that out. I'm going to e-mail a friend at Zeiss, and throw that question at him.

[[No...]]

To me it seems that the whole optical range of CMMs as well as their documentation is a bit neglected at Zeiss. Maybe it's because they're developed at the subsidiary in Cologne, not in Oberkochen like the normal CMMs. At least all the optic techs come from there.

The only thing I remember from the training is that correlation is not CNC capable. It seems to compare the brightness curve that was detected with edge analysis with the values returned by the actual AOI. If you set the method to correlation and then call edge analysis, there's (under manual) a parameter that somehow defines the width of a portion of the brightness curve, and another parameter where you specify a percentage. This seems to define how much the actual measurement must match the curve. You can also select different portions of the curve (the width varies with the above parameter).

That's what I was able to find out, but it doesn't really make sense to me.