(O-inspect machine) The C-Axis orientation during the CMM program is not indexing properly with respect to the camera.

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Hello gentlemen, I ran a program using Optic vision (O-inspect machine) and the C-Axis orientation during the CMM program is not indexing properly with respect to the camera. When the camera attempts to capture critical linear dimensions, the angle is slightly off, which can cause these features to measure oversized or undersized. However, when we check these same features using the VMM, they are conforming. Could anyone please help me to resolve this issue? 

Thanks in advance.

Henry-T