Offset RPS alignment

[[Pa...]]

Hello everyone,

I'm new here, but I've been working with GOM - ZEISS Inspect since 2021.

I got into a situation where I need some advice.

I have a lot of requests to measure and measure more parts, but I don't have time to measure so many parts. I know the parts (plastic) are the same and there is repeatability, so I thought I could make it easier by shifting the RPS alignment by a few hundred hundredths or tenths so that I have shifted deviations in all axes (this also applies to distances, etc.) or it is enough just to shift all values in the project by a few hundred hundredths.

I also work on a Wenzel touch 3D machine, and SW Quartis allows you to move the entire alignment by a given value, so I'm wondering if there is something similar in Inspect.

Thanks to all for your help.

Patrik

[[Ja...]]

Hi Patrick , are you talking about moving from scanning say every part to a sample inspection?   

I dont see that you need to touch the RPS but to track key metrics from sample inspection on a control chart for example.

I would be extremely nervous of attempting to create hypothetical data with an inspection...it just isnt really metrology at that point but more simulation 

 

if ive not understood can you elaborate further?

cheers

james

[[Pa...]]

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Hello James,

Thank you for your attention.

I finally solved the problem that bothered me by myself and it was something different from what you write.

Anyway, thank you.