Patterned Feature in Secondary Alignment

[[Ja...]]

I have a patterned point in a secondary alignment. When I run the program from the features list it wants to measure the first iteration of the point twice, so it measures Point1 then Point1(1). Running from the characteristics behaves the way you expect and only measures Point(1).

In short the program works like this:

Point1 and Circle1 are in the same pattern together. Its 3 iterations around an axis 120 degrees apart. Point1 is used to establish a Z height for Circle1. So Alignment1 is using Point1(*) as the Z origin and Circle1(*) alignment is set to Alignment1. If you run the program from the features list it will measure Point1 and it will measure the same point again but as Point1(1) then it moves to Point1(2), and then Point1(3). If you run the program from the characteristic list it will not measure Point1 and instead starts with Point1(1).

Anyone know a quick way to fix this, other than running from characteristics? I'm running Calypso 7.2.20 SP 5.

Thanks.

[[Ma...]]

Why pattern point which will only tell one nominal point for circle? Can you just fill formula to circle Z nominal?