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Two-point distance


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Hello everyone,

I would appreciate your help here. I have two opposite parallel planes, scanned with same strategy, filter applied, outlier elimination applied. Flatness of both 0,0007, parallelism 0,0015 max (left to right and vice versa).
I create characteristic "Two-point distance" create inside of it symetry plane through recall feature points of these two planes and evaluate "Envelope condition" or "min-max". The thing is, Idon't understand how there can be difference 0,014 when flatness of both and paralelism is not even 1 micron (ok, in attached protocol // is 0,0015, but still...). For me it does not make sense. Does this characteristic ignore filter and outlier elimination or what am I missing? Than you very much
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