Jump to content

Two Tier Probe Rack, Define parameters


Recommended Posts

This is a first, yay.
We use two tier probe racks, the lower level is offset towards Y- axis to accommodate Vast XT Styli systems.
Defining the Approach "Before and After" values is simple, and apparently only affects the tier in use.
This means if you pick up a probe from the top of the rack, it can and will smash into the lower tier pots. Yay again.

Is there a setting to define the Approach "Before and After" parameters for both tiers?
Setting a large approach value to satisfy the upper offset tier is not an option, I can afford the loss of travel between the rack and the part location (Large part on a Contura).

(Side note: Today, after running this job for several weeks, the software decides it will travel a different path than every time it ran for about 60 parts.)
Link to comment
https://qualityforum.zeiss.com/topic/20972-two-tier-probe-rack-define-parameters/
Share on other sites

The Head is a Vast XT Gold.
The upper rack sits back with enough clearance so the CMM can pick up probes from the bottom rack without a collision.
However, Calypso seemed to take a short cut today fro the upper rack, down and towards Y- axis thru the lower rack pots.
Wow, that sound's kind of buggish.
Only thing I could think of is if the CMM outer clearance plane got flipped or modified to make the CMM it thinks it has to go in the direction it did?.
Go to plan, navigation, and select the outer clearance plane to see if it doesn't cover the whole measurement and probe rack range.
Yep, I've read more than and few issues and that's why 6.2 continues to reside in my desk drawer.
It's only fair to mention that, I know for a fact many other metrology software's and operation units also have glitches with upgrades.
Even giant's like Microsofty has issues.
×
×
  • Create New...