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Stylus qualification in measurement plan


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It can be done, but requires the use of PCM. You would create a stylus qualification characteristic (found in resources->utilities) for each stylus that needs qualified, and then utilize PCM in the presettings of the program, or of the first alignment feature, to force the measurement.

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Actually,

If you run from characteristics instead of features, it will run the stylus qualification first and then do the base alignment. Just tested it out using simulation which should be the same as doing it on the actual machine.
This would be fine to do in a program that only uses one probe.
But if you have a program that uses multiple probes then you'll see constant probe changes.
Also the stylus qualification needs to be first on the list.

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Another thing you can do is just have the stylus qualification in the program but masked. Then train your inspector and operators to unmask and run and execute that only. After its done, then you can mask again and run the program.

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That is very interesting-what version of Calypso(service pack and patch) were you running? And what probehead? This doesn't match the behavior I saw on hardware, running from both the Characteristics list and the Features list, so I am wondering if something has changed in how Calypso behaves.

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Running Calypso 2021(Service pack 5, version 7.2.20) with an Accura mass CMM and RDS XXT in the simulation.
It's possible that it does not work on the actual machine but in the simulation it did run the stylus qualification before it went and did the base alignment. Just had to change the order of run from feature list to characteristic list.
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