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Part too tall for swivel position


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Hello,

I have a part that stands up quite tall on our cmm, and a stylus that is quite long to reach inside it.

After it does its stylus change, it appears to try to go to the Z+ CP, before it can do its swivel to point X-, which reaches its hardware end position.

How can one change this for just a few select features that use this long probe? Ideally I am hoping there is a solution that would be included for just this measurement plan and wouldn't have any universal changes that could mess with other programs.

I've tried manually changing the angle position on the probe as well and just running that feature, but it still tries to first go to the Z+ CP as if it were still pointing down (even though the feature is set at X+ CP).
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https://qualityforum.zeiss.com/topic/9784-part-too-tall-for-swivel-position/
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I had a similar situation and had to reduce the height of CP+Z clearance plane. Then, I had to control how I went from one side to the other using position points. I also had to use a Stylus Rotation position. On some occasions, I would measure a feature and then include position points to move away to a safe location and index RDS to next angle. All within the feature. This way, it wouldn't need to go up to the +Z CP or to the swivel position.
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